Title: Application of Mobility Spectrum Analysis to Modern Multi-layered IR Device Material
Abstract: Mobility spectrum analysis provides powerful insight into transport properties of multi-layered structures. This work focuses on characterization of two material systems at the forefront of infrared detection; incumbent HgCdTe technology and emergent III-V based superlattices. The applicability of variable-field Hall characterization and mobility spectrum analysis is demonstrated in a number of novel case studies for development of mid-wave and long-wave material.
Alexander Brown Defense Poster